Single-Shot Pulsed-LiDAR SPAD Sensor with on-chip Peak Detection for Background Rejection
Author:
Affiliation:
1. Dipartimento di Elettronica, Informazione e Bioingegneria (DEIB), Politecnico di Milano, Milano, Italy
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics
Link
http://xplorestaging.ieee.org/ielx7/2944/9613808/09795038.pdf?arnumber=9795038
Reference27 articles.
1. Lidar with SiPM: Some capabilities and limitations in real environment
2. Industrial exploitation of SiPM technology developed for basic research
3. Advanced Time-Correlated Single Photon Counting Techniques
4. Sampling Rate and ADC Resolution Requirements in Digital Front-End Electronics for TOF PET
5. A 0.13 μm CMOS System-on-Chip for a 512 × 424 Time-of-Flight Image Sensor With Multi-Frequency Photo-Demodulation up to 130 MHz and 2 GS/s ADC
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