Robust automatic void detection in solder balls
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx5/5487364/5494886/05495524.pdf?arnumber=5495524
Cited by 14 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Convolutional Attention Network with edge supervision for void and spot segmentation in chip resistors based on X-ray images;Optics and Lasers in Engineering;2024-07
2. Detection and location of mount chip and solder joint based on machine vision;Signal, Image and Video Processing;2024-05-23
3. Automated X-ray Defect Inspection on Occluded BGA Balls Using Hybrid Algorithm;Computers, Materials & Continua;2023
4. Void and solder joint detection for chip resistors based on X-ray images and deep neural networks;Microelectronics Reliability;2022-08
5. Layered Unsupervised Learning-based Identification and Quantification of Voids in Package Thermal Interface Materials;2022 21st IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (iTherm);2022-05-31
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