Author:
Scholz Mirko,Chen Shih-Hung,Thijs Steven,Linten Dimitri,Hellings Geert,Vandersteen Gerd,Sawada Masanori,Groeseneken Guido
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality,Electronic, Optical and Magnetic Materials
Cited by
7 articles.
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