Dynamic Voltage Overshoot During Triggering of an SCR-Type ESD Protection

Author:

Notermans GuidoORCID,Ritter Hans-MartinORCID,Holland SteffenORCID,Pogany Dionyz

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality,Electronic, Optical and Magnetic Materials

Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Transient Voltage Suppressor Diode Array Protection Circuits with Reducing Loading Effect under High-Power Microwave Pulse Injection;IEEE Transactions on Electromagnetic Compatibility;2024-04

2. A Physics-Based Model for Snapback-Type ESD Protection Devices;IEEE Transactions on Electromagnetic Compatibility;2023-10

3. Physics-based and Behavioural Models for the Dynamic Response of a TVS Diode;2023 International Symposium on Electromagnetic Compatibility – EMC Europe;2023-09-04

4. Improved SEED Modeling of an ESD Discharge to a USB Cable;IEEE Transactions on Electromagnetic Compatibility;2023-06

5. Investigation of Frequency Models to Predict Dynamic Behavior of ESD Protection Networks;IEEE Transactions on Electromagnetic Compatibility;2022-12

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