Author:
Mahapatra S.,Goel N.,Desai S.,Gupta S.,Jose B.,Mukhopadhyay S.,Joshi K.,Jain A.,Islam A. E.,Alam M. A.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Cited by
201 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Do Radiation and Aging Impact DVFS? TCAD-based Analysis on 22 nm FDSOI Latches;2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS);2024-07-03
2. Establishment of Degradation Model and Transfer Model for P-channel Power MOSFETs Under Negative Bias Temperature Stress;2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia);2024-05-17
3. NBTI Effect Survey for Low Power Systems in Ultra-Nanoregime;Current Nanoscience;2024-05
4. SUIT: Secure Undervolting with Instruction Traps;Proceedings of the 29th ACM International Conference on Architectural Support for Programming Languages and Operating Systems, Volume 2;2024-04-27
5. A comprehensive study of negative bias temperature instability in MOS structures;Microelectronics Reliability;2024-04