Experimental Research on Power Cycling of High Power Thyristor Based on Electromigration Degradation Model-Reference-Cited by-同舟云学术

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Experimental Research on Power Cycling of High Power Thyristor Based on Electromigration Degradation Model

Published:2023-05-12 Issue: Volume: Page:
ISSN:
Container-title:2023 IEEE 6th International Electrical and Energy Conference (CIEEC)
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Author:

Zhou Liang¹,Cui Chunyan¹,Li Kuanhong²,Chai Bin¹,Hu Jinzhao¹,Zhang Xiying³,Liu Yalan³

Affiliation:

1. State Grid Electric Power Research Institute, China C-EPRI Electric Power Engineering Co., Ltd.,NARI Group Corporation,Beiing,China,102200

2. State Grid Fujian Electric Power Co., Ltd. Sanming electric power supply company,Sanming,Fujian,China,365000

3. Zhuzhou CRRC Times Semiconductor Co., Ltd.,Zhuzhou,Hunan Province,China,412001

Funder

Science and technology project of State Grid Corporation of China

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10165685/10164836/10166108.pdf?arnumber=10166108

Reference15 articles.

1. Parameter analysis of electromigration acceleration test model and its trend study;jian;Semiconductor technology,2009

2. Via delamination-a novel electromigration failure mechanism

3. Failure rates and calculation methods for semiconductor devices in the United States;su'e;Electronic Product Reliability and Environmental Testing,0

4. Analysis of stress-induced electromigration failure;xuanlong;Reliability Physics and Failure Analysis Techniques,0

5. Electromigration and mechanical stress[ C];lloyd;Proc of Mater Res Soc Symp Proc,1991

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