Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software,Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
77 articles.
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1. Validation and Test Challenges for Multi-Memory Bus BIST Engines;2023 IEEE East-West Design & Test Symposium (EWDTS);2023-09-22
2. Modeling Faults as Addresses;2023 IEEE East-West Design & Test Symposium (EWDTS);2023-09-22
3. A Novel Circuit and Layout Design of SEU Tolerant SRAM in a 65nm CMOS Process;2023 IEEE 18th Conference on Industrial Electronics and Applications (ICIEA);2023-08-18
4. Bridging Repairability Gaps in Shared Bus Architecture with Shared Physical Memory Implementation;2023 IEEE International Test Conference India (ITC India);2023-07-23
5. Next Generation Design For Testability, Debug and Reliability Using Formal Techniques;2022 IEEE International Test Conference (ITC);2022-09