Author:
Palit Sambit,Xu Xin,Raman Arvind,Alam Muhammad Ashraful
Funder
National Nuclear Security Administration, Center for Prediction of Reliability, Integrity, and Survivability of Microsystems
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Cited by
8 articles.
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