1. N.R. Mann, R.E. Schafer, N.D. Singpurwalla, Methods for Statistical Analysis of Reliability and Life Data (Wiley, New York, 1974)
2. P.D.T. O’Connor, Practical Reliability Engineering (Wiley, 1991)
3. A.G. Sabnis, VLSI reliability, in VLSI Electronics Microstructure Science, ed. by N. G. Einspruch, vol. 22, (Academic Press, 1981). J. F. Lawless, Statistical Models and Methods for Lifetime Data, John Wiley & Sons, 1982
4. W.C. Riordan, R. Miller, J.M. Sherman, J. Hicks, Microprocessor reliability performance as a function of die location for a (0.25 μm) five layer metal CMOS logic process. Proc. IRPS, 1–11 (1996)
5. C.G. Shirley, A defect model of reliability. Tutorial, IRPS (1995)