Probabilistic design-for-reliability concept and novel approach to qualification testing of aerospace electronic products-Reference-Cited by-同舟云学术

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Probabilistic design-for-reliability concept and novel approach to qualification testing of aerospace electronic products

Published:2012-03 Issue: Volume: Page:
ISSN:
Container-title:2012 IEEE Aerospace Conference
language:
Short-container-title:

Author:

Suhir E.,Mahajan R.,Lucero A. E.,Bechou L.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/6178851/6186985/06187373.pdf?arnumber=6187373

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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