Analytical Modeling and Numerical Simulation of Nonlinear Thermal Effects in Bipolar Transistors-Reference-Cited by-同舟云学术

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Analytical Modeling and Numerical Simulation of Nonlinear Thermal Effects in Bipolar Transistors

Published:2022-09-28 Issue: Volume: Page:
ISSN:
Container-title:2022 28th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)
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Author:

D'Alessandro Vincenzo¹,Scognamillo Ciro¹,Catalano Antonio Pio¹,Muller Markus²,Schroter Michael²,Zampardi Peter J.³,Codecasa Lorenzo⁴

Affiliation:

1. University Federico II,Department of Electrical Engineering and Information Technology,Naples,Italy

2. Technical University Dresden,Germany

3. Qorvo, Inc.,Newbury Parko,CA,USA

4. Politecnico di Milano,Department of Electronics, Information, and Bioengineering,Milan,Italy

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9950458/9950600/09950637.pdf?arnumber=9950637

Reference31 articles.

1. Influence of Concurrent Electrothermal and Avalanche Effects on the Safe Operating Area of Multifinger Bipolar Transistors

2. Compact representation of temperature and power dependence of thermal resistance in Si, Inp and GaAs substrate devices using linear models

3. A critical review of thermal models for electro-thermal simulation

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Validation of Thermometer-Based Techniques to Experimentally Extract the Impact of Nonlinear Thermal Effects on the Thermal Resistance of Bipolar Transistors;Lecture Notes in Electrical Engineering;2023-11-29

2. A Circuit Designer's Perspective on Transistor Modelling Challenges for 6G, Fiberoptics, and Quantum Computing ICs;2023 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS);2023-10-16

3. Improved nonlinear electrothermal simulation of bipolar transistors: Application to InP/InGaAs DHBTs;2023 29th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC);2023-09-27

4. Characterization and Compact Modeling of the Thermal Resistance of SiGe HBTs From Cryogenic to Room Temperature;IEEE Transactions on Electron Devices;2023-09

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