Extracting a bias-dependent large signal MESFET model from pulsed I/V measurements-Reference-Cited by-同舟云学术

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Extracting a bias-dependent large signal MESFET model from pulsed I/V measurements

Published:1996-03 Issue:3 Volume:44 Page:372-378
ISSN:0018-9480
Container-title:IEEE Transactions on Microwave Theory and Techniques
language:
Short-container-title:IEEE Trans. Microwave Theory Techn.

Author:

Fernandez T.,Newport Y.,Zamanillo J.M.,Tazon A.,Mediavilla A.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Radiation

Link

http://xplorestaging.ieee.org/ielx1/22/10383/00486146.pdf?arnumber=486146

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