Robust Sine Wave Fitting in ADC Testing
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx5/4124238/4124239/04124467.pdf?arnumber=4124467
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. ADC Parameter Test Based on Improved Maximum Likelihood Estimation;2021 IEEE 15th International Conference on Electronic Measurement & Instruments (ICEMI);2021-10-29
2. A Fully Integrated BIST \(\Delta \Sigma \) ADC Using the In-Phase and Quadrature Waves Fitting Procedure;IEEE Transactions on Instrumentation and Measurement;2014-12
3. Real-Time High-Precision Reading Algorithm for the Ironless Inductive Position Sensor;IEEE Transactions on Nuclear Science;2013-10
4. The dual channel sinewave model: Co-prime sparse sampling, parameter estimation, and the Cramér–Rao Bound;Measurement;2012-11
5. Parameter Estimation Employing a Dual-Channel Sine-Wave Model Under a Gaussian Assumption;IEEE Transactions on Instrumentation and Measurement;2008-08
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