A Fully Integrated BIST <inline-formula> <tex-math notation="TeX">\(\Delta \Sigma \) </tex-math></inline-formula> ADC Using the In-Phase and Quadrature Waves Fitting Procedure-Reference-Cited by-同舟云学术

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A Fully Integrated BIST \(\Delta \Sigma \) ADC Using the In-Phase and Quadrature Waves Fitting Procedure

Published:2014-12 Issue:12 Volume:63 Page:2750-2760
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Hung Shao-Feng,Hong Hao-Chiao

Funder

Ministry of Science and Technology, Taiwan

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx7/19/6940066/06820774.pdf?arnumber=6820774

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Built in Self Test on Random Test Pattern Generation for Test Compression;2023 International Conference on Self Sustainable Artificial Intelligence Systems (ICSSAS);2023-10-18

2. One-Bit ΣΔ-Encoded Stimulus Generation for On-Chip ADC Test;Journal of Circuits, Systems and Computers;2020-07-02

3. A Digital Calibration Method for a MEMS Accelerometer based on Harmonic Self-Test;Journal of Physics: Conference Series;2020-04-01

4. An Alternative SNR Computation Method for ADC Testing;2019 XXXIV Conference on Design of Circuits and Integrated Systems (DCIS);2019-11

5. A ΣΔ Closed-Loop Interface for a MEMS Accelerometer with Digital Built-In Self-Test Function;Micromachines;2018-09-06

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