4H–SiC Metal–Semiconductor–Metal Ultraviolet Photodetectors in Operation of 450 $^{\circ}\hbox{C}$-Reference-Cited by-同舟云学术

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4H–SiC Metal–Semiconductor–Metal Ultraviolet Photodetectors in Operation of 450 $^{\circ}\hbox{C}$

Published:2012-11 Issue:11 Volume:33 Page:1586-1588
ISSN:0741-3106
Container-title:IEEE Electron Device Letters
language:
Short-container-title:IEEE Electron Device Lett.

Author:

Lien Wei-Cheng,Tsai Dung-Sheng,Lien Der-Hsien,Senesky Debbie G.,He Jr-Hau,Pisano Albert P.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/55/6335490/06329395.pdf?arnumber=6329395

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