Total Ionizing Dose Effects on Read Noise of MLC 3-D NAND Memories-Reference-Cited by-同舟云学术

Total Ionizing Dose Effects on Read Noise of MLC 3-D NAND Memories

Published:2022-03 Issue:3 Volume:69 Page:321-326
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Surendranathan Umeshwarnath¹^ORCID,Wasiolek Maryla²^ORCID,Hattar Khalid²^ORCID,Fleetwood Daniel M.³^ORCID,Ray Biswajit¹^ORCID

Affiliation:

1. Department of Electrical and Computer Engineering, The University of Alabama in Huntsville, Huntsville, AL, USA

2. Sandia National Laboratories, Albuquerque, NM, USA

3. Department of Electrical and Computer Engineering, Vanderbilt University, Nashville, TN, USA

Funder

U.S. Department of Energy (DOE), Office of Nuclear Energy through the DOE Idaho Operations Office as part of a Nuclear Science User Facilities Experiment

National Science Foundation

U.S. DOE’s National Nuclear Security Administration

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

https://ieeexplore.ieee.org/ielam/23/9735177/9667501-aam.pdf

Reference29 articles.

1. Error Instability in Floating Gate Flash Memories Exposed to TID

2. Radiation Induced Charge Trapping in Ultrathin ${\rm HfO}_{2}$-Based MOSFETs

3. Radiation-Induced Charge Trapping and Low-Frequency Noise of Graphene Transistors

4. Defects and Low-Frequency Noise in Irradiated Black Phosphorus MOSFETs With HfO2 Gate Dielectrics

5. Unified model of hole trapping, 1/f noise, and thermally stimulated current in MOS devices

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1. Towards Improving Ionizing Radiation Tolerance of 3-D NAND Flash Memory;2023 IEEE International Memory Workshop (IMW);2023-05

2. Electrostatic Shielding of NAND Flash Memory from Ionizing Radiation;2023 IEEE International Reliability Physics Symposium (IRPS);2023-03

3. Origin of post-irradiation V_th-shift variability in 3D-NAND memory array;IEEE Transactions on Nuclear Science;2023

4. Total-Ionizing-Dose Effects on Threshold Voltage Distribution of 64-Layer 3D NAND Memories;2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC);2022-07