Comparison of ESD Damage Test for Common-Mode Chokes With ESD Gun and TLP-HMM

Author:

Ito Hironori1,Yoshida Masahiro1ORCID,Yano Yusuke1ORCID,Wang Jianqing1ORCID,Ishida Takeshi2,Sawada Masanori3

Affiliation:

1. Graduate School of Engineering, Nagoya Institute of Technology, Nagoya, Japan

2. Department of Engineering, Noise Laboratory Company Ltd., Sagamihara, Kanagawa, Japan

3. Department of Development, Hanwa Electronic Ind. Company Ltd., Ogaito, Wakayama, Japan

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Reference19 articles.

1. A TLP-based Human Metal Model ESD-generator for device qualification according to IEC 61000-4-2

2. Delivering IEC 61000-4-2 current pulses through transmission lines at 100 and 330 ohm system impedances;grund;Proc Electrical Overstress/Electrostatic Discharge (EOS/ESD) Symp,2008

3. TLP-based Human Metal Model stress generator and analysis method of ESD generators

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