Improvement of ESD Damage Test Board for CMC for Automotive Ethernet-Reference-Cited by-同舟云学术

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Improvement of ESD Damage Test Board for CMC for Automotive Ethernet

Published:2024-09 Issue:3 Volume:6 Page:89-95
ISSN:2637-6423
Container-title:IEEE Letters on Electromagnetic Compatibility Practice and Applications
language:
Short-container-title:IEEE Lett. on Electromagn. Compat. Pract. and Appl.

Author:

Ito Hironori¹^ORCID,Yano Yusuke¹^ORCID,Ishida Takeshi²,Wang Jianqing¹^ORCID

Affiliation:

1. Graduate School of Engineering, Nagoya Institute of Technology, Nagoya, Japan

2. Product Development Department, Noise Laboratory Company Ltd., Sagamihara, Kanagawa, Japan

Funder

International Standardization Development Work on Energy Saving by the Ministry of Economics, Trade and Industry of Japan: “International Standardization on System Safety of Onboard Ethernet Project

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx7/8566057/10669074/10529132.pdf?arnumber=10529132

Reference15 articles.

1. Characterization of common-mode choke for automotive ethernet networks enabling 100 Mbit/s

2. Analysis and Assessment of the Common Mode Termination for Automotive Ethernet 1000BASE-T1

3. Characterizing and Modelling Common Mode Inductors at high Current Levels for System ESD Simulations

4. Automotive High-Speed Interfaces: Future Challenges for System-level HV-ESD Protection and First- Time-Right Design

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