Author:
Xu L.,Cao J.,Wen S.-J.,Fung R.,Markevitch J.,Ball D. R.,Bhuva B. L.
Cited by
2 articles.
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1. Single-Event Latchup Vulnerability at the 7-nm FinFET Node;2022 IEEE International Reliability Physics Symposium (IRPS);2022-03
2. Micro-Latchup Location and Temperature Characterization in a 7-nm Bulk FinFET Technology;2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS);2021-09