Low Power Embedded DRAMs with High Quality Error Correcting Capabilities
Author:
Ohler P.,Hellebrand S.
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Reducing Power Dissipation in SRAM during Test;Journal of Low Power Electronics;2006-08-01