Author:
Dilillo Luigi,Rosinger Paul,Al-Hashimi Bashir M.,Girard Patrick
Publisher
American Scientific Publishers
Subject
Electrical and Electronic Engineering
Cited by
2 articles.
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1. Low power test architecture for dynamic read destructive fault detection in SRAM;International Journal of Electronics;2018-01-15
2. RES eliminated fault detection;International Journal of Electronics Letters;2017-02-10