Impact of Annealing Temperature on MnO2 Thin Films: Morphological, Structural, and Electrical Properties
Author:
Affiliation:
1. Department of Electronics and Communication Engineering, National Institute of Technology Nagaland, Dimapur, India
2. Department of Electrical, Electronics and Communication Engineering, Tokyo City University, Tokyo, Japan
Funder
SERB, DST, Government of India
Sone Scholarship Fund from the Gotoh Educational Corporation
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://xplorestaging.ieee.org/ielx7/66/10299929/10238821.pdf?arnumber=10238821
Reference34 articles.
1. Effect of annealing temperature on structural morphological and optical properties of spray pyrolized Al-doped ZnO thin films
2. Tutorial on Powder X-ray Diffraction for Characterizing Nanoscale Materials
3. Post Annealing Effects on $\text{Er}_{2}\text{O}_{3}$ Nanowire Arrays for Improved Photodetection
4. Analysis of the Annealing Budget of Metal Oxide Thin‐Film Transistors Prepared by an Aqueous Blade‐Coating Process
5. Insulator–metal transition in substrate-independent VO2 thin film for phase-change devices
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