Affiliation:
1. Department of Industrial and Systems Engineering, Korea Advanced Institute of Science and Technology, Daejeon, Republic of Korea
Funder
National Research Foundation of Korea (NRF) Grant funded by the Korea Government
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference43 articles.
1. Applying Data Augmentation and Mask R-CNN-Based Instance Segmentation Method for Mixed-Type Wafer Maps Defect Patterns Classification
2. FlexMatch: Boosting semi-supervised learning with curriculum pseudo labeling;zhang;Proc Adv Neural Inf Process Syst,2021
3. Qualitative and Quantitative Analysis of Multi-Pattern Wafer Bin Maps
4. MixMatch: A holistic approach to semi-supervised learning;berthelot;Proc Adv Neural Inf Process Syst,2019
5. Attend, infer, repeat: Fast scene understanding with generative models;eslami;Proc Adv Neural Inf Process Syst,2016
Cited by
11 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献