Sample-imbalanced wafer map defects classification based on auxiliary classifier denoising diffusion probability model-Reference-Cited by-同舟云学术

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Sample-imbalanced wafer map defects classification based on auxiliary classifier denoising diffusion probability model

Published:2024-06 Issue: Volume:192 Page:110209
ISSN:0360-8352
Container-title:Computers & Industrial Engineering
language:en
Short-container-title:Computers & Industrial Engineering

Author:

Li Jialin^ORCID,Tao Ran,Chen Renxiang,Chen Yongpeng,Zhao Chengying,Huang Xianzhen

Publisher

Elsevier BV

Reference50 articles.

1. Deep learning algorithm for Gaussian noise removal from images;Aghajarian;Journal of Electronic Imaging,2020

2. Wafer map defect patterns classification using deep selective learning;Alawieh,2020

3. Data augmentation in classification and segmentation: A survey and new strategies;Alomar;Journal of Imaging,2023

4. Uncertainty-driven ensembles of multi-scale deep architectures for image classification;Arco;Information Fusion,2023

5. A systematic review of deep learning for silicon wafer defect recognition;Batool;IEEE Access,2021

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