Author:
Batool Uzma,Shapiai Mohd Ibrahim,Tahir Muhammad,Ismail Zool Hilmi,Zakaria Noor Jannah,Elfakharany Ahmed
Funder
Ministry of Higher Education of Malaysia through Malaysia Laboratories for Academia–Business Collaboration
Universiti Teknologi Malaysia
“Imbalanced strategy for wafer defect classification using fully convolutional neural network
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
General Engineering,General Materials Science,General Computer Science
Cited by
35 articles.
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