Author:
Carletta J.,Papachristou C.
Cited by
5 articles.
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1. Efficient LFSR Reseeding Based on Internal-Response Feedback;Journal of Electronic Testing;2014-09-30
2. A New LFSR Reseeding Scheme via Internal Response Feedback;2013 22nd Asian Test Symposium;2013-11
3. A Complete Logic BIST Technology with No Storage Requirement;2010 19th IEEE Asian Test Symposium;2010-12
4. Circular BIST with state skipping;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2002-10
5. Circular self-test path for FSMs;IEEE Design & Test of Computers;1996