1. Structural Built In Self Test of Analog Circuits using ON/OFF Keying and Delay Monitors;2024 IEEE 42nd VLSI Test Symposium (VTS);2024-04-22
2. A Method to Detect Open Defects in Wire Segments of On-Chip Power Grids;2020 IEEE 29th Asian Test Symposium (ATS);2020-11-23
3. Multiple soft fault diagnosis of DC analog CMOS circuits designed in nanometer technology;Analog Integrated Circuits and Signal Processing;2016-05-06
4. Analog and Mixed-Signal Test;Electronic Design Automation for IC System Design, Verification, and Testing;2016-04-14
5. Fast Monte Carlo-Based Estimation of Analog Parametric Test Metrics;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2014-12