Multiple soft fault diagnosis of DC analog CMOS circuits designed in nanometer technology-Reference-Cited by-同舟云学术

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Multiple soft fault diagnosis of DC analog CMOS circuits designed in nanometer technology

Published:2016-05-06 Issue:1 Volume:88 Page:65-77
ISSN:0925-1030
Container-title:Analog Integrated Circuits and Signal Processing
language:en
Short-container-title:Analog Integr Circ Sig Process

Author:

Tadeusiewicz Michał,Hałgas Stanisław

Publisher

Springer Science and Business Media LLC

Subject

Surfaces, Coatings and Films,Hardware and Architecture,Signal Processing

Link

http://link.springer.com/content/pdf/10.1007/s10470-016-0752-y.pdf

Reference27 articles.

1. Aminian, M., & Aminian, F. (2007). A modular fault-diagnostic system for analog electronic circuits using neural networks with wavelet transform as a preprocessor. IEEE Transactions on Instrumentation and Measurement, 56, 1546–1554.

2. Bhunia, S., Raychowdhury, A., & Roy, K. (2005). Defect oriented testing of analog circuits using wavelet analysis of dynamic supply current. Journal of Electronic Testing, 21, 147–159.

3. Catelani, M., & Fort, A. (2002). Soft fault detection and isolation in analog circuits: some results and a comparison between a fuzzy approach and radial basis function networks. IEEE Transactions on Instrumentation and Measurement, 51, 196–202.

4. Economikos, L., Morrison, T., & Crnic, F. (1994). Electrical test of multichip substrates. IEEE Transactions on Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, 17, 56–61.

5. Fedi, G., Giomi, R., Luchetta, A., Manetti, S., & Piccirilli, M. C. (1998). On the application of symbolic techniques to the multiple fault location in low testability analog circuits. IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing, 45, 1383–1388.

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