1. Concurrent Low Power Built-in Self-Test for Safety Critical SoCs;2024 IEEE 8th International Test Conference India (ITC India);2024-07-21
2. Basics of VLSI Testing and Debug;Understanding Logic Locking;2023-09-23
3. Runtime Testability on Autonomous System;IEEE Transactions on Reliability;2023-03
4. Low Power Address Generator using Improvised Clocking Scheme;2022 International Conference on Emerging Trends in Engineering and Medical Sciences (ICETEMS);2022-11-18
5. Design of TPG BIST Using Various LFSR for Low Power and Low Area;Communication, Software and Networks;2022-10-28