Diagnosis of interconnects and FPICs using a structured walking-1 approach
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Publisher
IEEE Comput. Soc. Press
Link
http://xplorestaging.ieee.org/ielx3/3889/11315/00512646.pdf?arnumber=512646
Cited by 18 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Single‐configuration fault detection in application‐dependent testing of field programmable gate array interconnects;IET Computers & Digital Techniques;2013-05
2. Fine grain faults diagnosis of FPGA interconnect;Microprocessors and Microsystems;2013-02
3. A Novel Heuristic Method for Application-Dependent Testing of a SRAM-Based FPGA Interconnect;IEEE Transactions on Computers;2013-01
4. High Resolution Application Specific Fault Diagnosis of FPGAs;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2011-10
5. An automated approach for the diagnosis of multiple faults in FPGA interconnects;2009 1st Asia Symposium on Quality Electronic Design;2009-07
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