Ionizing-Radiation Response and Low-Frequency Noise of 28-nm MOSFETs at Ultrahigh Doses-Reference-Cited by-同舟云学术

Ionizing-Radiation Response and Low-Frequency Noise of 28-nm MOSFETs at Ultrahigh Doses

Published:2020-07 Issue:7 Volume:67 Page:1302-1311
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Bonaldo Stefano^ORCID,Mattiazzo Serena^ORCID,Enz Christian^ORCID,Baschirotto Andrea,Fleetwood Daniel M.^ORCID,Paccagnella Alessandro^ORCID,Gerardin Simone^ORCID

Funder

Scaltech28 Experiment

Istituto Nazionale di Fisica Nucleare - INFN

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx7/23/9142457/09042291.pdf?arnumber=9042291

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