Radiation response of 28 nm CMOS transistors at high proton and neutron fluences for high energy physics applications

Author:

Termo G.ORCID,Borghello G.ORCID,Faccio F.,Michelis S.,Koukab A.,Sallese J.M.

Publisher

Elsevier BV

Reference45 articles.

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5. Influence of halo implantations on the total ionizing dose response of 28-nm pmosfets irradiated to ultrahigh doses;Bonaldo;IEEE Trans. Nucl. Sci.,2018

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