Author:
Baba Altug Hakan,Mitra Subhasish
Cited by
28 articles.
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1. Storage-Based Logic Built-In Self-Test with Variable-Length Test Data;2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2022-10-19
2. Asymmetric Symbol and Skew Sender Identification for Automotive Networks;IEEE Transactions on Information Forensics and Security;2022
3. Zoom-In Feature for Storage-Based Logic Built-In Self-Test;2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2021-10-06
4. Storage-Based Built-In Self-Test for Gate-Exhaustive Faults;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2021-10
5. A novel clustering technique using backscattering side channel for counterfeit IC detection;Cyber Sensing 2020;2020-04-24