Author:
Fang Hongxia,Chakrabarty Krishnendu,Jas Abhijit,Patil Srinivas,Tirumurti Chandra
Cited by
21 articles.
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1. Two-dimensional Search Space for Extracting Broadside Tests from Functional Test Sequences;ACM Transactions on Design Automation of Electronic Systems;2024-04-22
2. Expanding a Pool of Functional Test Sequences to Support Test Compaction;2023 IEEE 41st VLSI Test Symposium (VTS);2023-04-24
3. Test Sequences for Faults in the Scan Logic;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2022-10
4. India and Emerging Challenges in International Relations and Area Studies;India Quarterly: A Journal of International Affairs;2019-11-27
5. Selecting Functional Test Sequences for Defect Diagnosis;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2018-10