Automated Debug of Speed Path Failures Using Functional Tests-Reference-Cited by-同舟云学术

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Automated Debug of Speed Path Failures Using Functional Tests

Published:2009-05 Issue: Volume: Page:
ISSN:
Container-title:2009 27th IEEE VLSI Test Symposium
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Author:

McLaughlin Richard,Venkataraman Srikanth,Lim Carlston

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/5116585/5116586/05116615.pdf?arnumber=5116615

Cited by 28 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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3. Performance Screening Using Functional Path Ring Oscillators;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-06

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