Author:
Vellvehi M.,Perpina X.,Leon J.,Sanchez D.,Jorda X.,Millan J.
Cited by
2 articles.
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1. Novel Detachable & Flippable Probing Stage for Lock-in Thermography and Laser-based Fault Isolation Tool;2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA);2023-07-24
2. Humidity sensitivity of large area silicon sensors: Study and implications;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2020-10