Research of the Program Injection Method for Determing the SEFI Cross Section of STM32 Microcontroller
Author:
Affiliation:
1. NRNU MEPhI,JSC «SPELS»,Moscow,Russia
2. JSC «SPELS»,Moscow,Russia
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9802078/9801892/09802291.pdf?arnumber=9802291
Reference8 articles.
1. Analysis of SOI CMOS microprocessor's SEE sensitivity: Correlation of the results obtained by different test methods
2. Fault injection method for testing fault-tolerant system-on-chip microprocessors;chekmarev,2015
3. Detecting SEEs in Microprocessors Through a Non-Intrusive Hybrid Technique
4. Impact of data cache memory on the single event upset-induced error rate of microprocessors
5. Protons and heavy ions induced stuck bits on large capacity RAM’s, radiation and its effects on components and systems, 1993;duzellier;Proc 2nd Eur Conf RADECS,1993
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