Analysis of SOI CMOS microprocessor's SEE sensitivity: Correlation of the results obtained by different test methods-Reference-Cited by-同舟云学术

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Analysis of SOI CMOS microprocessor's SEE sensitivity: Correlation of the results obtained by different test methods

Published:2011-09 Issue: Volume: Page:
ISSN:
Container-title:2011 12th European Conference on Radiation and Its Effects on Components and Systems
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Author:

Gorbunov Maxim S.,Vasilegin Boris V.,Antonov Andrey A.,Osipenko Pavel N.,Zebrev Gennady I.,Anashin Vasily S.,Emeliyanov Vladimir V.,Ozerov Alexander I.,Useinov Rustem G.,Chumakov Alexander I.,Pechenkin Alexander A.,Yanenko Andrey V.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/6123710/6131283/06131444.pdf?arnumber=6131444

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Research of the Program Injection Method for Determing the SEFI Cross Section of STM32 Microcontroller;2022 Moscow Workshop on Electronic and Networking Technologies (MWENT);2022-06-09

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