Charge-Based Modeling of Radiation Damage in Symmetric Double-Gate MOSFETs
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials,Biotechnology
Link
http://xplorestaging.ieee.org/ielx7/6245494/8232486/08103743.pdf?arnumber=8103743
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2. Investigation on Performance for Silicon and GaAs Channel of Double-Gate MOSFETs;Lecture Notes in Electrical Engineering;2023-09-03
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