Evaluation of Reliability and Lifetime of 650-V GaN-on-Si Power Devices Fabricated on 200-mm CMOS-Compatible Process Platform for High-Density Power Converter Application

Author:

Yin Shan1,Lin Yiming1,Hao Ronghui1,Jin Shoudong1,He Chuan1,Yao Weigang1,Li Xingjun1,He Qingyuan1,Pu Xiaoqing1,Su Xiaoliang1,Zou Yanbo1,Cai Hui1,Lee Kye-Jin1,Wang Mike1,Guo Harry1,Shen Ke1,Wang Felix1,Chiu H.-C.1,Chen Larry1,Marcon Denis1,Wong Roy K.-Y.1

Affiliation:

1. Innoscience (Zhuhai) Technology Co., Ltd.,R&D Division,Zhuhai,China

Publisher

IEEE

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Investigation into the On-Resistance Shift Phenomenon of 650V Commercial GaN Power Devices with Different Structures;2023 IEEE 2nd International Power Electronics and Application Symposium (PEAS);2023-11-10

2. Characterization of Electrical Switching Safe Operation Area on Schottky-Type P-GaN Gate HEMTs;IEEE Transactions on Power Electronics;2023-07

3. A Systematic Characterization Method for Time-resolved Stability and Reliability Issues on Lateral GaN Power Devices;2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD);2023-05-28

4. Evaluation of Efficiency and Power Factor in 3-kW GaN-Based CCM/CRM Totem-Pole PFC Converters for Data Center Application;2023 11th International Conference on Power Electronics and ECCE Asia (ICPE 2023 - ECCE Asia);2023-05-22

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