Author:
Yaojiang Zhang ,Fan J.,Selli G.,Cocchini M.,de Paulis F.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Radiation
Cited by
82 articles.
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5. Use of Cavity Perturbation Techniques to Characterize Via-Plate Behavior;2023 IEEE/MTT-S International Microwave Symposium - IMS 2023;2023-06-11