Author:
Zhang Bingbing,Johlitz Michael,Lion Alexander,Ernst Leo,Jansen K. M. B.,Vu Duc-Khoi,Weiss Laurens
Cited by
3 articles.
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1. Numerical simulation of transient thermomechanical ageing effects;2022 23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE);2022-04-25
2. Peridynamic Modeling of Thermo-oxidative Degradation in Polymers;Reliability of Organic Compounds in Microelectronics and Optoelectronics;2022
3. EMC Oxidation Under High-Temperature Aging;Reliability of Organic Compounds in Microelectronics and Optoelectronics;2022