Author:
Fieback Moritz,Medeiros Guilherme Cardoso,Gebregiorgis Anteneh,Aziza Hassen,Taouil Mottaqiallah,Hamdioui Said
Cited by
22 articles.
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1. A synergistic fault tolerance framework for Mbit 28nm embedded RRAM;2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS);2024-07-03
2. Lifecycle Management of Emerging Memories;2024 IEEE European Test Symposium (ETS);2024-05-20
3. Analysis of Conductance Variability in RRAM for Accurate Neuromorphic Computing;2024 IEEE 25th Latin American Test Symposium (LATS);2024-04-09
4. Analyzing the Use of Temperature to Facilitate Fault Propagation in ReRAMs;2024 IEEE 25th Latin American Test Symposium (LATS);2024-04-09
5. Device-Aware Diagnosis for Yield Learning in RRAMs;2024 Design, Automation & Test in Europe Conference & Exhibition (DATE);2024-03-25