Author:
Bilber C.E.,Schmatz M.L.,Morf T.,Lott U.,Morifuji E.,Bachtold W.
Cited by
16 articles.
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1. Development of RFCMOS Technologies in the 1990s in Toshiba;2023 IEEE 15th International Conference on ASIC (ASICON);2023-10-24
2. Frequency and Temperature-Based Noise Figure Modeling for GaAs HEMTs;2022 IEEE 3rd Global Conference for Advancement in Technology (GCAT);2022-10-07
3. Noise Figure Modeling Subject to Frequency and Temperature for AlGaN/GaN HEMTs;2022 International Conference on Innovations in Science, Engineering and Technology (ICISET);2022-02-26
4. Direct Deembedding of Noise Factors for On-Wafer Noise Measurement;IEEE Transactions on Microwave Theory and Techniques;2017-03
5. A Clear-Cut Introduction to the De-embedding Concept;Microwave De-embedding;2014