Frequency dependence in interline capacitance measurements-Reference-Cited by-同舟云学术

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Frequency dependence in interline capacitance measurements

Published:2002-06 Issue:3 Volume:51 Page:537-543
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:en
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Stucchi M.,Maex K.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx5/19/21898/01017725.pdf?arnumber=1017725

Cited by 13 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Frequency estimation techniques in capacitance-to-frequency conversion measurement;Review of Scientific Instruments;2020-01-01

2. Characterizing the Capacitive Crosstalk in SRAM Cells Using Negative Bit-Line Voltage Stress;IEEE Transactions on Instrumentation and Measurement;2012-12

3. Capacitance Measurements of Two-Dimensional and Three-Dimensional IC Interconnect Structures by Quasi-Static $C$–$V$ Technique;IEEE Transactions on Instrumentation and Measurement;2012-07

4. Capacitance-Increase Method;IEEE Transactions on Instrumentation and Measurement;2010-04

5. Numerical study on surface acoustic wave method for determining Young's modulus of low-k films involved in multi-layered structures;Applied Surface Science;2006-12

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