7nm FinFET technology heavy ion SEL evaluation using Xilinx Versal as case study-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

7nm FinFET technology heavy ion SEL evaluation using Xilinx Versal as case study

Published:2021-09 Issue: Volume: Page:
ISSN:
Container-title:2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
language:
Short-container-title:

Author:

Dufour Arnaud¹,Carron Jerome¹,Pierron Francois²,Fongral Matthieu¹,Dangla David¹,Bascoul Guillaume¹,Bezerra Francoise¹,Mekki Julien¹,Malou Florence¹,Maillard Pierre³

Affiliation:

1. Cnes,Toulouse,France

2. Bibench,Toulouse,France

3. Xilinx Inc.,San Jose,CA,95124

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9954459/9954461/09954564.pdf?arnumber=9954564

Reference10 articles.

1. A Novel Error Rate Estimation Approach forUltraScale+ SRAM-based FPGAs

2. Applicability of FinFET Technologies for Space Applications;alexandrescu;AMICSA 2021,0

3. Putting the die contour back - Methods in advanced sample preparation for 3D and flip-chip devices

4. Single-Event Characterization of Xilinx UltraScale+® MPSOC under Standard and Ultra-High Energy Heavy-Ion Irradiation

5. Heavy Ion and Proton Induced Single Event Effects on Xilinx Zynq UltraScale+ Field Programmable Gate Array (FPGA)

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Evaluating embedded hardware for high-order wavefront sensing and control;Techniques and Instrumentation for Detection of Exoplanets XI;2023-10-05

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP