Single-Event Characterization of Xilinx UltraScale+® MPSOC under Standard and Ultra-High Energy Heavy-Ion Irradiation-Reference-Cited by-同舟云学术

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Single-Event Characterization of Xilinx UltraScale+® MPSOC under Standard and Ultra-High Energy Heavy-Ion Irradiation

Published:2018-07 Issue: Volume: Page:
ISSN:
Container-title:2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018)
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Author:

Glorieux Maximilien,Evans Adrian,Lange Thomas,In A-Duong,Alexandrescu Dan,Boatella-Polo Cesar,Alia Ruben Garcia,Tali Maris,Ortega Carlos Urbina,Kastriotou Maria,Fernandez-Martinez Pablo,Ferlet-Cavrois Veronique

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/8581398/8584255/08584296.pdf?arnumber=8584296

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Analysis of the Single-Event Latch-Up Cross section of a 16 nm FinFET System-on-Chip Using Backside Single-Photon Absorption Laser Testing and Correlation With Heavy Ion Data;IEEE Transactions on Nuclear Science;2024-08

2. CHARM High-Energy Ions for Microelectronics Reliability Assurance (CHIMERA);IEEE Transactions on Nuclear Science;2024-08

3. SpaceWire Based Reconfiguration and Redundancy Management of COTS Based Highly Integrated Onboard Computer;2023 European Data Handling & Data Processing Conference (EDHPC);2023-10-02

4. Comparison of Neutron Radiation Testing Approaches for a Complex SoC;IEEE Transactions on Nuclear Science;2023-04

5. Differences in MBUs induced by high-energy and medium-energy heavy ions in 28 nm FPGAs;Nuclear Science and Techniques;2022-09

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