Simplified Calculations of Radiation Dose-Rate Sensitivity of Bipolar Transistors-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Simplified Calculations of Radiation Dose-Rate Sensitivity of Bipolar Transistors

Published:2021-09 Issue: Volume: Page:
ISSN:
Container-title:2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
language:
Short-container-title:

Author:

Hjalmarson Harold. P.¹,Witczak Steven C.²,Roark Samuel Z.³,Van Ginhoven Renee⁴,Buchheit Thomas¹,Barnaby Hugh³,Adell Philippe⁵

Affiliation:

1. Sandia National Laboratories,Albuquerque,NM,87111

2. Northrop Grumman Corporation,Linthicum Heights,MD,21090

3. Arizona State University,Tempe,Arizona,85287

4. Air Force Weapons Laboratories,Albuquerque,NM,87185

5. California Institute of Technology,NASA Jet Propulsion Laboratory,Pasadena,CA,91101

Funder

U.S. Department of Energy

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9954459/9954461/09954578.pdf?arnumber=9954578

Reference20 articles.

1. Space charge limited degradation of bipolar oxides at low electric fields

2. Modeling low-dose-rate effects in irradiated bipolar-base oxides

3. Physical model for enhanced interface-trap formation at low dose rates

4. Calculations of Radiation Dose-Rate Sensitivity of Bipolar Transistors

5. Mechanisms Separating Time-Dependent and True Dose-Rate Effects in Irradiated Bipolar Oxides

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP