Author:
Mao Saijun,Popovic Jelena,Ferreira Jan Abraham
Cited by
2 articles.
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1. Temperature dependent trap characterisation and modelling of silicon carbide MOS capacitor;2024 25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE);2024-04-07
2. Review of SiC MOSFET Failure Analysis Under Extreme Conditions: High Temperature, High Frequency and Irradiation;Lecture Notes in Electrical Engineering;2022