Voltage Reference and Zero Current Detector Monolithically Integrated on p-GaN Technology Designed for Process Corners Compensation
Author:
Affiliation:
1. Wise-Integration,Meylan,France,38240
2. Univ. Grenoble Alpes,CEA, LETI,Grenoble,France,F-38000
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10131044/10130846/10131398.pdf?arnumber=10131398
Reference13 articles.
1. Sources 101: Audio Current Regulator Tests for High Performance;jung;Audio Magazine,2007
2. High-Bandwidth High-CMRR Current Measurement for a 4.8 MHz Multi-Level GaN Inverter AC Power Source;niklaus;2021 IEEE Applied Power Electronics Conference and Exposition (APEC),2021
3. Short-Circuit Protection for GaN Power Devices with Integrated Current Limiter and Commercial Gate Driver
4. Transient Overvoltage Detection Technique for GaN HEMTs Integrated in a 200-V GaN-on-SOI Process
5. 18.8 A 192pW Hybrid Bandgap-Vth Reference with Process Dependence Compensated by a Dimension-Induced Side-Effect
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